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2 - D A Y  W O R K S H O P
Metrics that Matter to R&D
Rapidly Deploying a Comprehensive
and Simple R&D Metrics System

 Dates & Location:
 June 24-25, 2008 / Chicago, IL

A two-day executive workshop on how to measure what really matters to improve R&D effectiveness and significantly increase bottom line results.

Course Instructor

Wayne Mackey
Product Development Consulting

Internationally Recognized Expert in Metrics and co-author of the best-selling book, Value Innovation Portfolio Management: Achieving Double-Digit Growth through Customer Value and co-author of the PDMA Toolbook for Product Development III

"Wayne Mackey's approach to metrics is focused on simplicity. That means simple to support, simple to understand, and simple to communicate. Our experience with Wayne's system has been that we can quickly establish metrics that are useful to the business immediately."

Donald M. DeLauder
Executive Director
Product Innovation and
Advanced Development


By attending this session, you will learn to:

  • Align company strategies with your R&D organizational goals

  • Incorporate the voice of the customer and organizational competencies into predictive measures of success

  • Systematically reduce the "massively many" R&D metrics down to the "critical few"

  • Differentiate R&D metrics for executive, management and implementation levels

  • Define everyday R&D operating targets and establish a simple, effective review system

Download Brochure

pdficon.gif (912 bytes) MetricsThatMatter.pdf

Course Info

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This workshop is strictly limited to 45 participants - early registration is strongly advised.