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2 - D A Y  W O R K S H O P
Metrics that Matter to R&D
Rapidly Deploying a Comprehensive
and Simple R&D Metrics System

 Dates & Location:
 June 24-25, 2008 / Chicago, IL


 "Wayne's common sense approach to metrics has focused our organization's leadership on performance excellence."   

Mike Gustafson
General Manager
Sedation Systems
Ethicon Endo-Surgery, Inc.
a Johnson & Johnson Company

"Wayne's basis for metrics have changed how our leadership team attacks and advances on the most important elements of our business. Its not about the process but the leadership thought process."

Brian Majeska
VP Technical

"Wayne's approach to making metrics work for companies is praiseworthy in its simplicity and effectiveness."

Laura Elan
(former) Director of Engineering
Shure Inc.

"Wayne Mackey's approach to R&D metrics is clearly anchored by his years of practical experience in industry. He provided straightforward guidance that enabled us to rapidly identify metrics associated with activities critical to achieving departmental and organizational objectives. His support through implementation was vital to integrating the process as part of our R&D culture."

Paul J. Vasta, Ph.D.
VP, Research & Development
Orthofix, Inc.

"Wayne Mackey's approach to metrics is focused on simplicity. That means simple to support, simple to understand, and simple to communicate. Our experience with Wayne's system has been that we can quickly establish metrics that are useful to the business immediately. We've used Wayne's approach to good effect in our R&D, Operations, and Sales/Service teams."

Donald M. DeLauder
Executive Director
Product Innovation and Advanced Development

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Course Info

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This workshop is strictly limited to 45 participants - early registration is strongly advised.